Scanning Electron Microscopy and X-Ray Microanalysis : Third Edition (9780306472923)

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

Product details

• Format Hardback | 689 pages
• Dimensions 178 x 254 x 35.56mm | 2,048g
• Publication date 30 Apr 2007
• Publisher Springer Science+Business Media
• Imprint Kluwer Academic/Plenum Publishers
• Publication City/Country New York, NY, United States
• Language English
• Edition Revised
• Edition Statement 3rd Corrected ed. 2003. Corr. 2nd printing 2007
• Illustrations note XIX, 689 p. With online files/update.
• ISBN10 0306472929
• ISBN13 9780306472923
• Bestsellers rank 1,053,738

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